55 search results - page 1 / 11 » Tolerating Radiation-Induced Transient Faults in Modern Proc... |
IJPP
2010
13 years 3 months ago
2010
PARELEC
2006
IEEE
13 years 11 months ago
2006
IEEE
Modern microprocessors get more and more susceptible to transient faults, e.g. caused by high-energetic particles due to high integration, clock frequencies, temperature and decre...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Future microprocessors will be highly susceptible to transient errors as the sizes of transistors decrease due to CMOS scaling. Prior techniques advocated full scale structural or...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
As technology scales toward deep submicron, on-chip interconnects are becoming more and more sensitive to noise sources such as power supply noise, crosstalk, radiation induced ef...
DAC
2003
ACM
14 years 6 months ago
2003
ACM
Interconnects have been shown to be a dominant source of energy consumption in modern day System-on-Chip (SoC) designs. With a large (and growing) number of electronic systems bei...