75 search results - page 3 / 15 » Tolerating hardware device failures in software |
ISQED
2007
IEEE
14 years 7 days ago
2007
IEEE
We present a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices ac...
ISORC
2006
IEEE
13 years 12 months ago
2006
IEEE
The increasing complexity of mobile phones directly affects their reliability, while the user tolerance for failures becomes to decrease, especially when the phone is used for bus...
ICCAD
2004
IEEE
14 years 2 months ago
2004
IEEE
Soft errors that change configuration bits of an SRAM based FPGA modify the functionality of the design. The proliferation of FPGA devices in various critical applications makes it...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
- The problem of determining lower bounds for the energy cost of a given nanoscale design is addressed via a complexity theory-based approach. This paper provides a theoretical fra...
ISCA
2010
IEEE
13 years 11 months ago
2010
IEEE
As technology scales ever further, device unreliability is creating excessive complexity for hardware to maintain the illusion of perfect operation. In this paper, we consider whe...