4 search results - page 1 / 1 » Transformation Invariance in Pattern Recognition-Tangent Dis... |
NIPS
1996
13 years 6 months ago
1996
In pattern recognition, statistical modeling, or regression, the amount of data is a critical factor affecting the performance. If the amount of data and computational resources ar...
ICIAP
2007
ACM
14 years 5 months ago
2007
ACM
In this paper, we propose the combination of the Self Organizing Map (SOM) and of the tangent distance for effective clustering in Document Image Analysis. The proposed model (SOM...
ICPR
2002
IEEE
13 years 9 months ago
2002
IEEE
When dealing with pattern recognition problems one encounters different types of a-priori knowledge. It is important to incorporate such knowledge into the classification method ...
ECML
2001
Springer
13 years 9 months ago
2001
Springer
In many applications, modelling techniques are necessary which take into account the inherent variability of given data. In this paper, we present an approach to model class speci...