18 search results - page 2 / 4 » Transient fault detection via simultaneous multithreading |
PARELEC
2006
IEEE
13 years 11 months ago
2006
IEEE
Modern microprocessors get more and more susceptible to transient faults, e.g. caused by high-energetic particles due to high integration, clock frequencies, temperature and decre...
ISPASS
2007
IEEE
13 years 11 months ago
2007
IEEE
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
ASPLOS
2000
ACM
13 years 9 months ago
2000
ACM
Processors execute the full dynamic instruction stream to arrive at the final output of a program, yet there exist shorter instruction streams that produce the same overall effec...
ICPP
2008
IEEE
13 years 11 months ago
2008
IEEE
The issue queue (IQ) is a key microarchitecture structure for exploiting instruction-level and thread-level parallelism in dynamically scheduled simultaneous multithreaded (SMT) p...
MICRO
2009
IEEE
13 years 12 months ago
2009
IEEE
Continued technology scaling is resulting in systems with billions of devices. Unfortunately, these devices are prone to failures from various sources, resulting in even commodity...