2 search results - page 1 / 1 » Transistor Flaring in Deep Submicron-Design Considerations |
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
Abstract - The deep sub-micron regime has broughtup several manufacturing issues which impact circuit-performance and design. One such issue is flaring of transistors which causes ...
ISPD
1998
ACM
13 years 8 months ago
1998
ACM
In this paper, we formulate a new class of optimization problem, named the general CH-posynomial program, and reveal the general dominance property. We propose an efcient algorith...