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GLVLSI
1999
IEEE
86views VLSI» more  GLVLSI 1999»
13 years 8 months ago
Transistor Stuck-Open Fault Detection in Multilevel CMOS Circuits
Mostafa H. Abd-El-Barr, Yanging Xu, Carl McCrosky
ITC
1989
IEEE
82views Hardware» more  ITC 1989»
13 years 8 months ago
CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
Jerry M. Soden, R. Keith Treece, Michael R. Taylor...