2 search results - page 1 / 1 » Transparent Word-Oriented Memory BIST Based on Symmetric Mar... |
EDCC
1999
Springer
13 years 10 months ago
1999
Springer
Abstract. The paper presents a new approach to transparent BIST for wordoriented RAMs which is based on the transformation of March transparent test algorithms to the symmetric ver...
VLSID
2001
IEEE
14 years 6 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...