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» Trench IGBT failure mechanisms evolution with temperature an...

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MR
2007

144views Robotics» more MR 2007»

Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions

13 years 4 months ago

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Two extreme configurations under short circuit conditions leading to the punch through Trench IGBT failure under the effect of the temperature and the gate resistance have been st...

A. Benmansour, Stephane Azzopardi, J. C. Martin, E...

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MR
2007

96views Robotics» more MR 2007»

A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D

13 years 4 months ago

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A systematic methodology is developed in order to clarify the punch through Trench Insulated Gate Bipolar Transistor (T-IGBT) failure mechanisms which can occur under extreme oper...

A. Benmansour, Stephane Azzopardi, J. C. Martin, E...

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