3 search results - page 1 / 1 » Ultra low-cost defect protection for microprocessor pipeline... |
ASPLOS
2006
ACM
13 years 10 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
DSN
2005
IEEE
13 years 10 months ago
2005
IEEE
Device scaling and large scale integration have led to growing concerns about soft errors in microprocessors. To date, in all but the most demanding applications, implementing par...