This paper explores an inherent tension in modeling and querying uncertain data: simple, intuitive representations of uncertain data capture many application requirements, but the...
Anish Das Sarma, Omar Benjelloun, Alon Y. Halevy, ...
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...
Dinesh Patil, Sunghee Yun, Seung-Jean Kim, Alvin C...