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DAGM
2004
Springer
13 years 10 months ago
Using Pattern Recognition for Self-Localization in Semiconductor Manufacturing Systems
In this paper we present a new method for self-localization on wafers using geometric hashing. The proposed technique is robust to image changes induced by process variations, as o...
Michael Lifshits, Roman Goldenberg, Ehud Rivlin, M...
AMT
2006
Springer
107views Multimedia» more  AMT 2006»
13 years 8 months ago
An Intelligent Process Monitoring System in Complex Manufacturing Environment
In high-tech industries, most manufacturing processes are complexly intertwined, in that manufacturers or engineers can hardly control a whole set of processes. They are only capa...
Sung Ho Ha, Boo-Sik Kang
HICSS
2007
IEEE
85views Biometrics» more  HICSS 2007»
13 years 11 months ago
Scale and Scope Externalities in Growth of IT Industries in India: An Agglomeration Perspective
Externalities occur among agglomerated firms. Scale externalities occur between firms in an industry with similar activities. Scope externalities occur when heterogeneous activiti...
Robert J. Kauffman, Ajay Kumar
TASE
2008
IEEE
13 years 4 months ago
An Intelligent Online Monitoring and Diagnostic System for Manufacturing Automation
Condition monitoring and fault diagnosis in modern manufacturing automation is of great practical significance. It improves quality and productivity, and prevents damage to machine...
Ming Ge, Yangsheng Xu, Ruxu Du
WSC
2004
13 years 6 months ago
Analysis of Supply Chains Using System Dynamics, Neural Nets, and Eigenvalues
Supply chain management is a critically significant strategy that enterprises depend on in meeting the challenges of today's highly competitive and dynamic business environme...
Luis Rabelo, Magdy Helal, Chalermmon Lertpattarapo...