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DAC
2004
ACM
14 years 5 months ago
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
Chong Zhao, Xiaoliang Bai, Sujit Dey
TPDS
2008
175views more  TPDS 2008»
13 years 4 months ago
Centralized versus Distributed Schedulers for Bag-of-Tasks Applications
Multiple applications that execute concurrently on heterogeneous platforms compete for CPU and network resources. In this paper, we consider the problem of scheduling applications ...
Olivier Beaumont, Larry Carter, Jeanne Ferrante, A...