Metastability is a phenomenon that can cause system failures in digital circuits. It may occur whenever signals are being transmitted across asynchronous or unrelated clock domain...
This paper characterizes the workload seen at the storage subsystem of an e-commerce system. Measurements are conducted on multi-tiered systems running three different benchmarks,...
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Commercial applications such as databases and Web servers constitute the largest and fastest-growing segment of the market for multiprocessor servers. Ongoing innovations in disk ...
The time required to simulate a complete benchmark program using the cycle-accurate model of a microprocessor can be prohibitively high. One of the proposed methodologies, represe...