3 search results - page 1 / 1 » Utilization of SECDED for soft error and variation-induced d... |
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Combination of SECDED with a redundancy technique can effectively tolerate a high variation-induced defect rate in future processes. However, while a defective cell in a block can...
PRDC
2006
IEEE
13 years 11 months ago
2006
IEEE
As SRAM devices are scaled down, the number of variation-induced defective memory cells increases rapidly. Combination of ECC, particularly SECDED, with a redundancy technique can...
DFT
1999
IEEE
13 years 9 months ago
1999
IEEE
A programmable single-chip multiprocessor system for video coding has been developed. The system is implemented in a high-performance 0.25 m logic/embedded DRAM process. It integr...