17 search results - page 4 / 4 » Valiant's Universal Circuit is Practical |
ICCAD
2004
IEEE
14 years 1 months ago
2004
IEEE
edicate Abstraction and Induction Edmund Clarke Daniel Kroening June 25, 2004 CMU-CS-04-131 School of Computer Science Carnegie Mellon University Pittsburgh, PA 15213 It is common...
IFIP
2001
Springer
13 years 9 months ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...