21 search results - page 2 / 5 » Variation resilient adaptive controller for subthreshold cir... |
ISVLSI
2007
IEEE
13 years 10 months ago
2007
IEEE
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance ...
TVLSI
2008
13 years 3 months ago
2008
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance o...
HPCA
2009
IEEE
13 years 11 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
TIM
2010
12 years 11 months ago
2010
In this paper, a novel low-power design technique is proposed to minimize the standby leakage power in nanoscale CMOS very large scale integration (VLSI) systems by generating the ...
VLSID
2007
IEEE
14 years 4 months ago
2007
IEEE
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...