1229 search results - page 1 / 246 » Variational Linear Response |
NIPS
2003
13 years 6 months ago
2003
A general linear response method for deriving improved estimates of correlations in the variational Bayes framework is presented. Three applications are given and it is discussed ...
ISQED
2008
IEEE
13 years 12 months ago
2008
IEEE
Large-scale process fluctuations (particularly random device mismatches) at nanoscale technologies bring about highdimensional strongly nonlinear performance variations that canno...
ICCAD
2005
IEEE
14 years 2 months ago
2005
IEEE
Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations....
ICPR
2000
IEEE
14 years 6 months ago
2000
IEEE
Rotation of the illuminant source about a subject textured surface can cause catastrophic failure of texture classification schemes. This is due to the variation of texture featur...
DAC
2007
ACM
14 years 6 months ago
2007
ACM
The number and magnitude of process variation sources are increasing as we scale further into the nano regime. Today's most successful response surface methods limit us to lo...