355 search results - page 1 / 71 » Verification of Embedded Memory Systems using Efficient Memo... |
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
TACAS
1998
Springer
13 years 9 months ago
1998
Springer
This paper enables symbolic ternary simulation of systems with large embedded memories. Each memory array is replaced with a behavioral model, where the number of symbolic variable...
ENTCS
2008
13 years 5 months ago
2008
This paper presents our solutions to some problems we encountered in an ongoing attempt to verify the micro-hypervisor currently developed within the Robin project. The problems t...
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
ICCD
2003
IEEE
14 years 1 months ago
2003
IEEE
NAND flash memory has become an indispensable component in embedded systems because of its versatile features such as non-volatility, solid-state reliability, low cos,t and high d...