14 search results - page 1 / 3 » Worst-Case and Average-Case Analysis of n-Detection Test Set... |
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
TIT
2010
12 years 11 months ago
2010
This paper considers recovery of jointly sparse multichannel signals from incomplete measurements. Several approaches have been developed to recover the unknown sparse vectors from...
ICDAR
2009
IEEE
13 years 2 months ago
2009
IEEE
Segmentation of ancient documents is challenging. In the worst cases, text characters become fragmented as the results of strong degradation processes. New active contour methods ...
KDD
2003
ACM
14 years 5 months ago
2003
ACM
Defining outliers by their distance to neighboring examples is a popular approach to finding unusual examples in a data set. Recently, much work has been conducted with the goal o...
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
In nanometer regime, the effects of variations are having an increasing impact on the delay and power characteristics of devices as well as the yield of the circuit. Statistical t...