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IOLTS
2003
IEEE
133views Hardware» more  IOLTS 2003»
13 years 9 months ago
Power Consumption of Fault Tolerant Codes: the Active Elements
On-chip global interconnections in very deep submicron technology (VDSM) ICs are becoming more sensitive and prone to errors caused by power supply noise, crosstalk noise, delay v...
Daniele Rossi, Steven V. E. S. van Dijk, Richard P...
CASES
2007
ACM
13 years 8 months ago
INTACTE: an interconnect area, delay, and energy estimation tool for microarchitectural explorations
Prior work on modeling interconnects has focused on optimizing the wire and repeater design for trading off energy and delay, and is largely based on low level circuit parameters....
Rahul Nagpal, Arvind Madan, Bharadwaj Amrutur, Y. ...