Sciweavers

6 search results - page 2 / 2
» Worst-case design and margin for embedded SRAM
Sort
View
CODES
2010
IEEE
13 years 3 months ago
Statistical approach in a system level methodology to deal with process variation
The impact of process variation in state of the art technology makes traditional (worst case) designs unnecessarily pessimistic, which translates to suboptimal designs in terms of...
Concepción Sanz Pineda, Manuel Prieto, Jos&...