3 search results - page 1 / 1 » Yield prediction for architecture exploration in nanometer t... |
CODES
2006
IEEE
13 years 10 months ago
2006
IEEE
Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
MICRO
2009
IEEE
13 years 11 months ago
2009
IEEE
Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Large SRAM structures used for caches are particularly ...
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...