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DATE
2000
IEEE
134views Hardware» more  DATE 2000»
13 years 9 months ago
An on Chip ADC Test Structure
In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
Yun-Che Wen, Kuen-Jong Lee
DATE
2000
IEEE
110views Hardware» more  DATE 2000»
13 years 9 months ago
A BIST Scheme for On-Chip ADC and DAC Testing
In this paper, we present a BIST scheme for testing onchip AD and DA converters. We discuss on-chip generation of linear ramps as test stimuli, and propose techniques for measurin...
Jiun-Lang Huang, Chee-Kian Ong, Kwang-Ting Cheng
ADC
2000
Springer
146views Database» more  ADC 2000»
13 years 9 months ago
Handling Dynamic Schema Change in Process Models
Workflow technology has emerged as an appropriate platform for consolidating the distributed information resources of an enterprise, promoting interoperability across cross-platfo...
Shazia W. Sadiq
ADC
2000
Springer
82views Database» more  ADC 2000»
13 years 9 months ago
Querying Databases of Annotated Speech
Annotated speech corpora are databases consisting of signal data along with time-aligned symbolic ‘transcriptions’. Such databases are typically multidimensional, heterogeneou...
Steve Cassidy, Steven Bird
ADC
2000
Springer
326views Database» more  ADC 2000»
13 years 9 months ago
T-Tree or B-Tree: Main Memory Database Index Structure Revisited
While the B-tree (or the B+ -tree) is the most popular index structure in disk-based relational database systems, the Ttree has been widely accepted as a promising index structure...
Hongjun Lu, Yuet Yeung Ng, Zengping Tian