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19
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ats 2000
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Functional Testing of Microprocessors with Graded Fault Coverage
13 years 8 months ago
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www.cecs.uci.edu
Rajesh Kannah, C. P. Ravikumar
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Testing in the Fourth Dimension
13 years 8 months ago
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www.smdp2vlsi.gov.in
Vishwani D. Agrawal, Kwang-Ting Cheng
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Fast hierarchical test path construction for DFT-free controller-datapath circuits
13 years 8 months ago
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www.eng.yale.edu
Yiorgos Makris, Jamison Collins, Alex Orailoglu
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An adjacency-based test pattern generator for low power BIST design
13 years 8 months ago
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dit.upc.es
Patrick Girard, Loïs Guiller, Christian Landr...
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A new framework for static timing analysis, incremental timing refinement, and timing simulation
13 years 8 months ago
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poisson.usc.edu
Liang-Chi Chen, Sandeep K. Gupta, Melvin A. Breuer
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