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CAIP
2003
Springer
114views Image Analysis» more  CAIP 2003»
13 years 8 months ago
A Structural Framework for Assembly Modeling and Recognition
Christian Bauckhage, Franz Kummert, Gerhard Sagere...
CAIP
2003
Springer
134views Image Analysis» more  CAIP 2003»
13 years 8 months ago
Discrete Morphology with Line Structuring Elements
Cris L. Luengo Hendriks, Lucas J. van Vliet
CAIP
2003
Springer
164views Image Analysis» more  CAIP 2003»
13 years 9 months ago
A New Sharpness Measure Based on Gaussian Lines and Edges
Judith Dijk, Michael van Ginkel, Rutger J. van Ass...