12 search results - page 2 / 3 » ddecs 2008 |
DDECS
2008
IEEE
13 years 6 months ago
2008
IEEE
Defects not described by conventional fault models are a challenge for state-of-the-art fault diagnosis techniques. The X-fault model has been introduced recently as a modeling te...
DDECS
2008
IEEE
13 years 11 months ago
2008
IEEE
Abstract—In Network-on-Chip (NoC) application design, coreto-node mapping is an important but intractable optimization problem. In the paper, we use simulated annealing to tackle...
DDECS
2008
IEEE
13 years 11 months ago
2008
IEEE
—A new FPGA implementation for adaptive median filters is proposed. Adaptive median filters exhibit better filtering properties than standard median filters; however, their i...
DDECS
2008
IEEE
13 years 11 months ago
2008
IEEE
— Due to ever increasing design sizes more efficient tools for Automatic Test Pattern Generation (ATPG) are needed. Recently ATPG based on Boolean satisfiability (SAT) has been ...
DDECS
2008
IEEE
13 years 11 months ago
2008
IEEE
— Testing SoC is a challenging task, especially when addressing complex and highfrequency devices. Among the different techniques that can be exploited, Software-Based Selft-Test...