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    DEPCOS
    2006
    IEEE
    93views Hardware» more  DEPCOS 2006»
    Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers
    13 years 11 months ago
    Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers
    Download  home.mit.bme.hu
    Zoltán Micskei, István Majzik
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    DEPCOS
    2006
    IEEE
    85views Hardware» more  DEPCOS 2006»
    Survey of Recovery Schemes in MPLS Networks
    13 years 8 months ago
    Survey of Recovery Schemes in MPLS Networks
    Download  ethesys.lib.pu.edu.tw
    Luísa Jorge, Teresa Gomes
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