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DFT
1998
IEEE
13 years 10 months ago
1998
IEEE
This paper describes a system suited to support the Fault Injection process for microprocessor-based embedded systems. The system exploits a low-cost hardware board to monitor the...
DFT
1998
IEEE
13 years 10 months ago
1998
IEEE
This paper presents a system to evaluate the testability of an on-line testable circuit. The system operates at the RT-level, before the logic synthesis step, and allows for an ex...
TCAD
1998
13 years 5 months ago
1998
—We study the effect of the controller on the testability of sequential circuits composed of controllers and data paths. We show that even when all the loops of the circuit have ...
DFT
1998
IEEE
13 years 10 months ago
1998
IEEE
The statistical variations in electrical parameters, such as transistor gain factors and interconnect resistances, due to variations in the manufacturing process are studied using...
DFT
1998
IEEE
13 years 10 months ago
1998
IEEE
We present the results of hardware experiments designed to determine the relative contribution of CMOS coupling mechanisms to off-path signal variations caused by common types of ...