35 search results - page 7 / 7 » dsn 2000 |
DSN
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper concerns the validity of a widely used method for estimating the architecture-level mean time to failure (MTTF) due to soft errors. The method first calculates the fai...
DSN
2006
IEEE
13 years 11 months ago
2006
IEEE
Protecting the register value and its data buses is crucial to reliable computing in high-performance microprocessors due to the increasing susceptibility of CMOS circuitry to sof...
DSN
2005
IEEE
13 years 7 months ago
2005
IEEE
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture-level studies of soft errors since the architecture can mask many raw errors an...
DSN
2000
IEEE
13 years 9 months ago
2000
IEEE
ÐWe study the quality of service (QoS) of failure detectors. By QoS, we mean a specification that quantifies 1) how fast the failure detector detects actual failures and 2) how we...
DSN
2007
IEEE
13 years 11 months ago
2007
IEEE
Aggressive CMOS scaling will make future chip multiprocessors (CMPs) increasingly susceptible to transient faults, hard errors, manufacturing defects, and process variations. Exis...