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DSN
2008
IEEE
13 years 11 months ago
2008
IEEE
In future large-scale multi-core microprocessors, hard errors and process variations will create dynamic heterogeneity, causing performance and power characteristics to differ amo...
DSN
2008
IEEE
13 years 11 months ago
2008
IEEE
This paper proposes a formally well-rooted and extensible framework for dependability evaluation: Arcade (architectural dependability evaluation). It has been designed to combine ...
DSN
2008
IEEE
13 years 11 months ago
2008
IEEE
Soft state in the middle tier is key to enabling scalable and responsive three tier service architectures. While softstate can be reconstructed upon failure, replicating it across...
DSN
2008
IEEE
13 years 11 months ago
2008
IEEE
As semiconductor technology scales, reliability is becoming an increasingly crucial challenge in microprocessor design. The rSRAM and voltage scaling are two promising circuit-lev...
DSN
2008
IEEE
13 years 6 months ago
2008
IEEE
We describe a specific application of assurance cases to the problem of ensuring that a transition from a legacy system to its replacement will not compromise mission assurance ob...