With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
Recent research in embedded computing indicates that packing multiple processor cores on the same die is an effective way of utilizing the ever-increasing number of transistors. T...
We present AutoDVS, a dynamic voltage scaling (DVS) system for hand-held computers. Unlike extant DVS systems, AutoDVS distinguishes common, course-grain, program behavior and cou...
Passive monitoring or testing of complex systems and networks running in the field can provide valuable insights into their behavior in actual environments of use. In certain con...
Current consumer electronics devices do not interoperate and are hard to use. Devices use proprietary, device-specific and inflexible protocols. Resources across device classes, s...