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ET
2010
62views more  ET 2010»
13 years 3 months ago
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences
Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwa...
BISE
2010
90views more  BISE 2010»
13 years 4 months ago
Letter to the Editor: Statements on the Contribution by Urbach et al. from Issue 4/2009
Hans Ulrich Buhl, Peter Mertens, Matthias Schumann...