12 search results - page 3 / 3 » forte 2000 |
ISPASS
2007
IEEE
13 years 10 months ago
2007
IEEE
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
HPCA
2000
IEEE
13 years 8 months ago
2000
IEEE
This paper explores area/parallelism tradeo s in the design of distributed shared-memory (DSM) multiprocessors built out of large single-chip computing nodes. In this context, are...