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ICCAD
1994
IEEE
13 years 10 months ago
1994
IEEE
ICCAD
1994
IEEE
13 years 10 months ago
1994
IEEE
ICCAD
1994
IEEE
13 years 10 months ago
1994
IEEE
This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity...
ICCAD
1994
IEEE
13 years 10 months ago
1994
IEEE
We consider two versions of the problem of folding a stack of equal width components. In both versions, when a stack is folded, a routing penalty is incurred at the fold. In one v...
ICCAD
1994
IEEE
13 years 10 months ago
1994
IEEE
We consider the problem of testing for delay faults in macrobased circuits. Macro-based circuits are obtained as a result of technology mapping. Gate-level fault models cannot be ...