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ICCD
2006
IEEE
14 years 2 months ago
2006
IEEE
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...
ICCD
2006
IEEE
14 years 2 months ago
2006
IEEE
— As silicon CMOS devices are scaled down into the nanoscale regime, new challenges at both the device and system level are arising. While some of these challenges will be overco...
ICCD
2006
IEEE
14 years 2 months ago
2006
IEEE
— Caches, block memories, predictors, state tables, and other forms of on-chip memory are continuing to consume a greater portion of processor designs with each passing year. Mak...
ICCD
2006
IEEE
14 years 2 months ago
2006
IEEE
— The influence of interconnects on processor performance and cost is becoming increasingly pronounced with technology scaling. In this paper, we present a fast compression sche...
ICCD
2006
IEEE
14 years 2 months ago
2006
IEEE
Pointer bugs associated with dynamically-allocated objects resulting in out-of-bounds memory access are an important class of software bugs. Because such bugs cannot be detected e...