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IC3
2009
13 years 3 months ago
Multi-scale Modeling and Analysis of Nano-RFID Systems on HPC Setup
In this paper we have worked out on some the complex modeling aspects such as Multi Scale modeling, MATLAB Sugar based modeling and have shown the complexities involved in the anal...
Rohit Pathak, Satyadhar Joshi
ICCAD
2009
IEEE
135views Hardware» more  ICCAD 2009»
13 years 3 months ago
Enhanced reliability-aware power management through shared recovery technique
While Dynamic Voltage Scaling (DVS) remains as a popular energy management technique for real-time embedded applications, recent research has identified significant and negative i...
Baoxian Zhao, Hakan Aydin, Dakai Zhu
ICCAD
2009
IEEE
87views Hardware» more  ICCAD 2009»
13 years 3 months ago
Mitigation of intra-array SRAM variability using adaptive voltage architecture
SRAM cell design is driven by the need to satisfy static noise margin, write margin and read current margin (RCM) over all cells in the array in an energy-efficient manner. These ...
Ashish Kumar Singh, Ku He, Constantine Caramanis, ...
ICDE
2009
IEEE
173views Database» more  ICDE 2009»
13 years 3 months ago
Efficient Mining of Closed Repetitive Gapped Subsequences from a Sequence Database
There is a huge wealth of sequence data available, for example, customer purchase histories, program execution traces, DNA, and protein sequences. Analyzing this wealth of data to ...
Bolin Ding, David Lo, Jiawei Han, Siau-Cheng Khoo
ICTAC
2009
Springer
13 years 3 months ago
Integration Testing from Structured First-Order Specifications via Deduction Modulo
Testing from first-order specifications has mainly been studied for flat specifications, that are specifications of a single software module. However, the specifications of large s...
Delphine Longuet, Marc Aiguier