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ISQED
2000
IEEE
13 years 9 months ago
2000
IEEE
ISQED
2000
IEEE
13 years 9 months ago
2000
IEEE
Power and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to ...
ISQED
2000
IEEE
13 years 9 months ago
2000
IEEE
The lognormal has been traditionally used to model the failure time distribution of electromigration failures. However, when used to estimate the failure of large metal layers, it...
ISQED
2000
IEEE
13 years 9 months ago
2000
IEEE
We address the problem of power estimation at the register-transfer level (RTL). At this level, the circuit is described in terms of a set of interconnected memory elements and co...
ISQED
2000
IEEE
13 years 9 months ago
2000
IEEE
A new algorithm to determine the number and value of realistic worst-case models for the performance of module library components is presented in this paper. The proposed algorith...