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ISQED
2005
IEEE
95views Hardware» more  ISQED 2005»
13 years 11 months ago
Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature
The purpose of this work is to explore how device operation parameters such as switching speed and power dissipation scale with voltage and temperature. We simulated a CMOS ring o...
Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein
ISQED
2005
IEEE
92views Hardware» more  ISQED 2005»
13 years 11 months ago
Evaluation of Capacitor Ratios in Automated Accurate Common-Centroid Capacitor Arrays
In this paper, design and measurement results of a test chip that intends to evaluate differences between layout techniques for rectangular unit-capacitor arrays are introduced. P...
DiaaEldin Khalil, Mohamed Dessouky, Vincent Bourgu...
ISQED
2005
IEEE
128views Hardware» more  ISQED 2005»
13 years 11 months ago
Reliability-Centric Hardware/Software Co-Design
This paper proposes a reliability-centric hardware/ software co-design framework. This framework operates with a component library that provides multiple alternates for a given ta...
Suleyman Tosun, Nazanin Mansouri, Ercument Arvas, ...
ISQED
2005
IEEE
81views Hardware» more  ISQED 2005»
13 years 11 months ago
An ILP Formulation for Reliability-Oriented High-Level Synthesis
Reliability decisions taken early in system design can bring significant benefits in terms of design quality. This paper presents a 0-1 integer linear programming (ILP) formulatio...
Suleyman Tosun, Ozcan Ozturk, Nazanin Mansouri, Er...
ISQED
2005
IEEE
76views Hardware» more  ISQED 2005»
13 years 11 months ago
Technology Mapping for Reliability Enhancement in Logic Synthesis
Abstract— Reliability enhancements are traditionally implemented through redundancies at the system level or through the use of harden-cell-designs at the circuit level. Reliabil...
Zhaojun Wo, Israel Koren