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    ISQED
    2009
    IEEE
    99views Hardware» more  ISQED 2009»
    Improving the accuracy of rule-based equivalence checking of system-level design descriptions by identifying potential internal
    13 years 11 months ago
    Improving the accuracy of rule-based equivalence checking of system-level design descriptions by identifying potential internal
    Download  www.cad.t.u-tokyo.ac.jp
    Hiroaki Yoshida, Masahiro Fujita
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    ISQED
    2009
    IEEE
    109views Hardware» more  ISQED 2009»
    Variation-tolerant hierarchical voltage monitoring circuit for soft error detection
    13 years 11 months ago
    Variation-tolerant hierarchical voltage monitoring circuit for soft error detection
    Download  www.ece.rochester.edu
    Ashay Narsale, Michael C. Huang
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    ISQED
    2009
    IEEE
    135views Hardware» more  ISQED 2009»
    Simultaneous test pattern compaction, ordering and X-filling for testing power reduction
    13 years 11 months ago
    Simultaneous test pattern compaction, ordering and X-filling for testing power reduction
    Download  eda.ee.ucla.edu
    Ju-Yueh Lee, Yu Hu, Rupak Majumdar, Lei He
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    ISQED
    2009
    IEEE
    70views Hardware» more  ISQED 2009»
    Place and route considerations for voltage interpolated designs
    13 years 11 months ago
    Place and route considerations for voltage interpolated designs
    Download  www.eecs.harvard.edu
    — Voltage interpolation is a promising post fabrication technique for combating the effects of process variations. The benefits of voltage interpolation are well understood. It...
    Kevin Brownell, Ali Durlov Khan, David Brooks, Gu-...
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    ISQED
    2009
    IEEE
    69views Hardware» more  ISQED 2009»
    Parametric analysis to determine accurate interconnect extraction corners for design performance
    13 years 11 months ago
    Parametric analysis to determine accurate interconnect extraction corners for design performance
    Download  extreme-da.com
    In this paper we propose a technique to determine accurate interconnect extraction corners for a 65-nm design using parametric RC extraction and timing analysis. We calculate the ...
    Ayhan A. Mutlu, Jiayong Le, Ruben Molina, Mustafa ...
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