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8

ITC
1998
IEEE

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An introduction to area array probing

13 years 9 months ago

An introduction to area array probing

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Frederick L. Taber

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8

ITC
1998
IEEE

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Modeling the unknown! Towards model-independent fault and error diagnosis

13 years 9 months ago

Modeling the unknown! Towards model-independent fault and error diagnosis

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Vamsi Boppana, Masahiro Fujita

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14

ITC
1998
IEEE

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DFT guidance through RTL test justification and propagation analysis

13 years 9 months ago

DFT guidance through RTL test justification and propagation analysis

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Yiorgos Makris, Alex Orailoglu

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8

ITC
1998
IEEE

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Consequences of port restrictions on testing two-port memories

13 years 9 months ago

Consequences of port restrictions on testing two-port memories

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Said Hamdioui, A. J. van de Goor

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9

ITC
1998
IEEE

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Failure modes for stiction in surface-micromachined MEMS

13 years 9 months ago

Failure modes for stiction in surface-micromachined MEMS

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Abhijeet Kolpekwar, Ronald D. Blanton, David Woodi...

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