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ITC
2000
IEEE
13 years 10 months ago
2000
IEEE
The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describ...
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
ITC
2000
IEEE
13 years 10 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
ITC
2000
IEEE
13 years 10 months ago
2000
IEEE
—This paper presents Algorithm-level REcomputing with Shifted Operands (ARESO), which is a new register transfer (RT) level time redundancy-based concurrent error detection (CED)...
ITC
2000
IEEE
13 years 10 months ago
2000
IEEE
Concurrent error detection (CED) techniques (based on hardware duplication, parity codes, etc.) are widely used to enhance system dependability. All CED techniques introduce some ...