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This paper reviews the main failure mechanisms occurring in modern power modules paying special attention to insulated gate bipolar transistor devices for high-power applications....

Mauro Ciappa

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MR
2002

103views Robotics» more MR 2002»

ESD protection design for CMOS RF integrated circuits using polysilicon diodes

13 years 4 months ago

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ESD protection design for CMOS RF integrated circuits is proposed in this paper by using the stacked polysilicon diodes as the input ESD protection devices to reduce the total inp...

Ming-Dou Ker, Chyh-Yih Chang

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12

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MR
2002

63views Robotics» more MR 2002»

Transient thermal analysis of multilayered structures using Green's functions

13 years 4 months ago

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This paper presents an approach to the analysis of transient thermal states in electronic circuits using an analytical solution of the heat equation. Fully three-dimensional analy...

Marcin Janicki, Gilbert De Mey, Andrzej Napieralsk...

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