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TCAD
1998
102views more  TCAD 1998»
13 years 4 months ago
A unified MOSFET channel charge model for device modeling in circuit simulation
Yuhua Cheng, Kai Chen 0002, Kiyotaka Imai, Chenmin...
TCAD
1998
81views more  TCAD 1998»
13 years 4 months ago
Characterization and parameterized generation of synthetic combinational benchmark circuits
Michael D. Hutton, Jonathan Rose, Jerry P. Grossma...
TCAD
1998
109views more  TCAD 1998»
13 years 4 months ago
Diagnosing realistic bridging faults with single stuck-at information
Successful failure analysis requires accurate fault diagnosis. This paper presents a method for diagnosing bridging faults that improves on previous methods. The new method uses s...
David B. Lavo, Brian Chess, Tracy Larrabee, F. Joe...