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TCAD
1998
125views more  TCAD 1998»
13 years 4 months ago
Test-point insertion: scan paths through functional logic
—Conventional scan design imposes considerable area and delay overheads. To establish a scan chain in the test mode, multiplexers at the inputs of flip-flops and scan wires are...
Chih-Chang Lin, Malgorzata Marek-Sadowska, Kwang-T...
TCAD
1998
91views more  TCAD 1998»
13 years 4 months ago
Cost-free scan: a low-overhead scan path design
Conventional scan design imposes considerable area and delay overhead by using larger scan ip- ops and additional scan wires without utilizing the functionality of the combinatio...
Chih-Chang Lin, Malgorzata Marek-Sadowska, Mike Ti...
TCAD
1998
115views more  TCAD 1998»
13 years 4 months ago
Probabilistic modeling of dependencies during switching activity analysis
—This paper addresses, from a probabilistic point of view, the issue of switching activity estimation in combinational circuits under the zero-delay model. As the main theoretica...
Radu Marculescu, Diana Marculescu, Massoud Pedram
TCAD
1998
107views more  TCAD 1998»
13 years 4 months ago
Optimizing dominant time constant in RC circuits
— Conventional methods for optimal sizing of wires and transistors use linear resistor-capacitor (RC) circuit models and the Elmore delay as a measure of signal delay. If the RC ...
Lieven Vandenberghe, Stephen P. Boyd, Abbas A. El ...
TCAD
1998
125views more  TCAD 1998»
13 years 4 months ago
BDD-based synthesis of extended burst-mode controllers
Abstract—We examine the implications of a new hazard-free combinational logic synthesis method [1], which generates multiplexor-based networks from binary decision diagrams (BDDs...
Kenneth Y. Yun, Bill Lin, David L. Dill, Srinivas ...