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VTS
1998
IEEE
98views Hardware» more  VTS 1998»
13 years 9 months ago
Experimental Results for IDDQ and VLV Testing
An experimental test chip was designed and manufactured to evaluate different test techniques. Based on the results presented in the wafer probe, 309 out of 5491 dies that passed ...
Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu,...
TIC
1998
Springer
127views System Software» more  TIC 1998»
13 years 9 months ago
Stack-Based Typed Assembly Language
In previous work, we presented a Typed Assembly Language (TAL). TAL is sufficiently expressive to serve as a target language for compilers of high-level languages such as ML. More...
J. Gregory Morrisett, Karl Crary, Neal Glew, David...