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VLSID
1995
IEEE
104views VLSI» more  VLSID 1995»
13 years 8 months ago
A VLSI architecture for the computation of NURBS patches
Meenakshisundaram Gopi, Swami Manohar
VLSID
1995
IEEE
109views VLSI» more  VLSID 1995»
13 years 8 months ago
Logic minimization based approach for compressing image data
Jacob Augustine, Wen Feng, James Jacob
VLSID
1995
IEEE
113views VLSI» more  VLSID 1995»
13 years 8 months ago
VLSI design of systematic odd-weight-column byte error detecting SEC-DED codes
Luca Penzo, Donatella Sciuto, Cristina Silvano
VLSID
1995
IEEE
107views VLSI» more  VLSID 1995»
13 years 8 months ago
Functional test generation for non-scan sequential circuits
Mandyam-Komar Srinivas, James Jacob, Vishwani D. A...
VLSID
1995
IEEE
112views VLSI» more  VLSID 1995»
13 years 8 months ago
An efficient automatic test generation system for path delay faults in combinational circuits
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...