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VLSID
2001
IEEE
14 years 4 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
VLSID
2001
IEEE
14 years 4 months ago
2001
IEEE
Since battery life directly impacts the extent and duration of mobility, one of the key considerations in the design of a mobile embedded system should be to maximize the energy d...