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VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
Despite all of the advantages that circular BIST ofsers compared to conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion, it has se...
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
We address the problem of rectifying an incorrect combinational circuit against a given specification. Based on the symbolic BDD techniques, we consider the rectification process,...