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VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
This paper presents adaptive techniques for improving delay fault diagnosis. These techniques reduce the search space for direct probing which can save a lot of time during failur...
VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
This paper presents a new fault-tolerance technique for cache memories. Current fault-tolerance techniques for caches are limited either by the number of faults that can be tolera...
VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
Sequential test generators fail to yield tests for some stuck-at-faults because they are unable to reach certain states necessary for exciting propagating these target faults. Add...