21 search results - page 1 / 5 » vts 2002 |
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
We present a test methodology to allow testing high-speed circuits with low-speed ATEs. The basic strategy is adding an interface circuit to partially supply test data, coordinate...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
In this paper, we present a test pattern generation algorithm aiming at signal integrity faults on long interconnects. This is achieved by considering the effect of inputs and par...